IP Library › Assignment 014228/0705
Patent Assignment
Reel/Frame 014228/0705

Assignment of Assignor's Interest

Recorded: 2003-06-24 Pages: 2
Assignors
OCHIAI, ISAO
Executed: 2003-05-09
KUROSAKI, TOSHIEI
Executed: 2003-05-15
KUBO, TOSHIRO
Executed: 2003-05-16
SUZUKI, NAOMASA
Executed: 2003-05-19
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-24, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Electron Microscope Including Apparatus for X-Ray Analysis and Method of Analyzing Specimens Using Same
Patent: 6,765,205 →
Application: 10/601,531 →
Publication: US 2004/0099805
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →