Patent Assignment
Reel/Frame 014389/0273
Assignment of Assignor's Interest
Recorded: 2003-08-14
Pages: 3
Assignors
SCHEINER, DAVID
Executed: 2003-07-17
MANY, YOAV
Executed: 2003-07-17
GULIAMOV, RAHAMIM
Executed: 2003-07-17
GOV, SHAHAR
Executed: 2003-07-17
Assignee
NOVA MEASURING INSTRUMENTS LTD
WEIZMANN SCIENTIFIC PARK, P.O.B. 266, REHOVOT 76100, ISRAEL
Covered Property
(1)
Method and System for Thickness Measurements of Thin Conductive Layers
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.