Patent Assignment
Reel/Frame 014520/0678
Assignment of Assignor's Interest
Recorded: 2004-04-14
Pages: 2
Assignor
JAU, JACK
Executed: 2004-04-02
Assignee
HERMES-MICROVISION, INC.
1595 MCCANDLESS DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Property
(1)
Method and system for inline process monitoring of etching uniformity across a wafer
Application:
60/518,865 →
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Apr 19, 2004
From: CHEN, ZHONG WEI
To: HERMES-MICROVISION (TAIWAN) INC.
Reel/Frame 015225/0702 →
Corrective Coversheet to Correct the Assignor Previously Recorded on Reel 015225, Frame 0702.
Nov 10, 2004
From: HERMES-MICROVISION, INC.
To: HERMES-MICROVISION (TAIWAN) INC.
Reel/Frame 015381/0028 →