Patent Assignment
Reel/Frame 014638/0264
Assignment of Assignor's Interest
Recorded: 2003-10-22
Pages: 4
Assignors
AOKI, EIJI
Executed: 2003-10-08
KOBAYASHI, SHINJI
Executed: 2003-10-08
MARUMO, TOSHIYUKI
Executed: 2003-10-16
AKIMA, SHINJI
Executed: 2003-10-16
Assignees
SHARP KABUSHIKI KAISHA
22-22, NAGAIKE-CHO, ABENO-KU, OSAKA-SHI, OSAKA, 545-8522, JAPAN
TOPPAN PRINTING CO., LTD.
5-1, TAITO 1-CHOME, TAITO-KU, TOKYO, 110-8560, JAPAN
Covered Property
(1)
Photomask Defect Testing Method, Photomask Manufacturing Method and Semiconductor Integrated Circuit Manufacturing Method
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.