IP Library Assignment 014787/0793
Patent Assignment
Reel/Frame 014787/0793

Assignment of Assignor's Interest

Recorded: 2004-06-29 Pages: 3
Assignors
WANG, HUNG-CHI
Executed: 2004-05-10
LIN, WEI-FENG
Executed: 2004-05-10
Assignee
POWERCHIP SEMICONDUCTOR CORP.
NO. 12, LI-HSIN RD. I, SCIENCE-BASED INDUSTRIAL, PARK, HSIN-CHU CITY, TAIWAN
Covered Property (1)
Device and Method for Testing an Exposure Apparatus
Patent: 7,145,644 →
Application: 10/710,243 →
Publication: US 2005/0190348
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jun 24, 2019
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 049562/0154 →
Assignment of Assignor's Interest Jul 14, 2019
From: POWERCHIP TECHNOLOGY CORPORATION
To: POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
Reel/Frame 049746/0981 →