IP Library › Assignment 014795/0729
Patent Assignment
Reel/Frame 014795/0729

Assignment of Assignor's Interest

Recorded: 2003-12-10 Pages: 2
Assignors
DOI, MASARU
Executed: 2003-11-11
MIURA, TAKEO
Executed: 2003-11-11
Assignee
ADVANTEST CORPORATION
1-32-1, ASAHI-CHO, NERIMA-KU, TOKYO, 179-0071, JAPAN
Covered Property (1)
Apparatus and Method for Testing Semiconductor Device
Patent: 7,283,920 →
Application: 10/732,763 →
Publication: US 2004/0122620
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Address Dec 18, 2018
From: ADVANTEST CORPORATION
To: ADVANTEST CORPORATION
Reel/Frame 047987/0626 →