Assignment of Assignor's Interest

Recorded: 2004-02-23 Pages: 3

Assignor

SEIKO INSTRUMENTS INC.

Executed: 2004-02-06

Assignee

SII NANOTECHNOLOGY INC.

8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, JAPAN

Covered Properties (5)

Scanning Near-Field Optic/Atomic Force Microscope

Patent: 6,229,609 →

Application: 08/225,756 →

Optical Probe Having Tapered Wave Guide and Scanning Near-Field Optical Microscope Utilizing Optical Probe

Patent: 6,104,030 →

Application: 08/821,532 →

Probe,Manufacturing Method Therefor and Scanning Probe Microscope

Patent: 5,960,147 →

Application: 08/821,533 →

Method for Sharpening a Probe

Patent: 6,280,647 →

Application: 09/310,268 →

Optical Fiber Probe and Cantilever with Microscopic Aperture, and Method of Forming Microscopic Openings

Patent: 6,580,852 →

Application: 09/765,548 →

Publication: US 2002/0076184

Related Assignments (1)

Other recorded transfers of the patents in this record — the chain of ownership.