IP Library Assignment 015159/0928
Patent Assignment
Reel/Frame 015159/0928

Assignment of Assignor's Interest

Recorded: 2004-03-26 Pages: 2
Assignor
HATA, YOJI
Executed: 2003-10-20
Assignee
UMC JAPAN
1580 YAMAMOTO, TATEYAMA CITY, CHIBA, 294-8502, JAPAN
Covered Property (1)
Lsi Inspection Method and Defect Inspection Data Analysis Apparatus
Patent: 7,123,041 →
Application: 10/809,322 →
Publication: US 2004/0203179
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 18, 2013
From: UMC JAPAN
To: UNITED MICROELECTRONICS CORP.
Reel/Frame 029820/0811 →