Patent Assignment
Reel/Frame 015171/0808
Assignment of Assignor's Interest
Recorded: 2004-03-31
Pages: 4
Assignors
TAKEKOSHI, KIYOSHI
Executed: 2004-03-12
HOSAKA, HISATOMI
Executed: 2004-03-12
HAGIHARA, JUNICHI
Executed: 2004-03-12
HATSUSHIKA, KUNIHIKO
Executed: 2004-03-12
USUI, TAKAMASA
Executed: 2004-03-15
KANEKO, HISASHI
Executed: 2004-03-15
HAYASAKA, NOBUO
Executed: 2004-03-15
IDO, YOSHIYUKI
Executed: 2004-03-17
Assignees
TOKYO ELECTRON LIMITED
3-6, AKASAKA 5-CHOME, MINATO-KU, TOKYO 107-8481, JAPAN
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO 105-8001, JAPAN
IBIDEN CO., LTD.
1, KANDA-CHO 2-CHOME, OGAKI-SHI, GIFU 503-8604, JAPAN
Covered Property
(1)
Reliability Evaluation Test Apparatus, Reliability Evaluation Test System, Contactor, and Reliability Evaluation Test Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.