IP Library › Assignment 023839/0755
Patent Assignment
Reel/Frame 023839/0755

Assignment of Assignor's Interest

Recorded: 2010-01-26 Pages: 3
Assignor
KABUSHIKI KAISHA TOSHIBA
Executed: 2010-01-15
Assignees
TOKYO ELECTRON LIMITED
3-1, AKASAKA 5-CHOME, MINATO-KU, TOKYO, 107-6325, JAPAN
IBIDEN CO., LTD.
1-KANDA-CHO 2-CHOME, OGAKI-SHI, GIFU, 503-8604, JAPAN
Covered Property (1)
Reliability Evaluation Test Apparatus, Reliability Evaluation Test System, Contactor, and Reliability Evaluation Test Method
Patent: 7,091,733 →
Application: 10/813,257 →
Publication: US 2004/0183561
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Mar 31, 2004
From: TAKEKOSHI, KIYOSHI; HOSAKA, HISATOMI; HAGIHARA, JUNICHI; HATSUSHIKA, KUNIHIKO
To: TOKYO ELECTRON LIMITED; KABUSHIKI KAISHA TOSHIBA; IBIDEN CO., LTD.
Reel/Frame 015171/0808 →