Patent Assignment
Reel/Frame 015322/0674
Assignment of Assignor's Interest
Recorded: 2004-05-12
Pages: 3
Assignor
MATSUOKA, RYOICHI
Executed: 2004-04-02
Assignee
SEIKO INSTRUMENTS INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Method and Apparatus of Evaluating Layer Matching Deviation Based on Cad Information
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.