IP Library Assignment 015327/0021
Patent Assignment
Reel/Frame 015327/0021

Assignment of Assignor's Interest

Recorded: 2004-05-12 Pages: 3
Assignors
CHAND, AMI
Executed: 2004-05-10
OKULAN, NIHAT
Executed: 2004-05-10
Assignee
VEECO INSTRUMENTS INC.
100 SUNNYSIDE BOULEVARD, WOODBURY, NEW YORK, 11797
Covered Property (1)
Methods of Fabricating Structures for Characterizing Tip Shape of Scanning Probe Microscope Probes and Structures Fabricated Thereby
Patent: 7,096,711 →
Application: 10/844,200 →
Publication: US 2005/0252282
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 28, 2010
From: VEECO INSTRUMENTS INC.
To: VEECO METROLOGY INC.
Reel/Frame 025051/0290 →
Change of Name Jun 11, 2012
From: VEECO METROLOGY INC.
To: BRUKER NANO, INC.
Reel/Frame 028350/0511 →