IP Library Assignment 015598/0307
Patent Assignment
Reel/Frame 015598/0307

Assignment of Assignor's Interest

Recorded: 2004-07-23 Pages: 4
Assignors
KAITO, TAKASHI
Executed: 2004-06-21
NISHIKAWA, OSAMU
Executed: 2004-06-21
YAGYU, TAKAYA
Executed: 2004-06-21
Assignees
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME,, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
KANAZAWA INSTITUTE OF TECHNOLOGY
7-1 OHGIGAIKA, NONOICHI-MACHI,, ISHIKAWA-GUN, ISHIKAWA, JAPAN
Covered Property (1)
Scanning Atom Probe
Patent: 6,797,952 →
Application: 10/205,919 →
Publication: US 2003/0066962
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →