Patent Assignment
Reel/Frame 015799/0573
Assignment of Assignor's Interest
Recorded: 2004-09-17
Pages: 3
Assignor
KUNIHIRO, TAKASHI
Executed: 2004-08-11
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-8001, JAPAN
Covered Property
(1)
Test Method and Test Apparatus for Semiconductor Device