Patent Assignment
Reel/Frame 015846/0612
Assignment of Assignor's Interest
Recorded: 2004-10-01
Pages: 4
Assignors
YASUTAKE, MASATOSHI
Executed: 2004-08-17
AKINAGA, HIROYUKI
Executed: 2004-08-17
YOKOYAMA, HIROSHI
Executed: 2004-08-17
Assignees
SEIKO INSTRUMENTS INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
3-1, KASUMIGASEKI 1-CHOME, CHIYODA-KU, TOKYO, JAPAN
Covered Property
(1)
Scanning Probe Microscope for Ultra Sensitive Electro-Magnetic Field Detection and Probe Thereof
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.