IP Library › Assignment 032239/0511
Patent Assignment
Reel/Frame 032239/0511

Change of Name

Recorded: 2014-02-04 Pages: 16
Assignor
SII NANOTECHNOLOGY INC.
Executed: 2013-01-01
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property (1)
Scanning Probe Microscope for Ultra Sensitive Electro-Magnetic Field Detection and Probe Thereof
Patent: 6,817,231 →
Application: 10/331,540 →
Publication: US 2003/0172726
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 1, 2004
From: YASUTAKE, MASATOSHI; AKINAGA, HIROYUKI; YOKOYAMA, HIROSHI
To: SEIKO INSTRUMENTS INC.; NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Reel/Frame 015846/0612 →
Assignment of Assignor's Interest Feb 18, 2005
From: SEIKO INSTRUMENTS INC.
To: SII NANOTECHNOLOGY INC.
Reel/Frame 015748/0103 →