IP Library › Assignment 015748/0103
Patent Assignment
Reel/Frame 015748/0103

Assignment of Assignor's Interest

Recorded: 2005-02-18 Pages: 3
Assignor
SEIKO INSTRUMENTS INC.
Executed: 2005-02-15
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, JAPAN
Covered Properties (2)
Scanning Probe Microscope for Ultra Sensitive Electro-Magnetic Field Detection and Probe Thereof
Patent: 6,817,231 →
Application: 10/331,540 →
Publication: US 2003/0172726
Calorimeter and Manufacturing Method Thereof
Patent: 6,786,632 →
Application: 10/647,944 →
Publication: US 2004/0037343
Related Assignments (3)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 1, 2004
From: YASUTAKE, MASATOSHI; AKINAGA, HIROYUKI; YOKOYAMA, HIROSHI
To: SEIKO INSTRUMENTS INC.; NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Reel/Frame 015846/0612 →
Change of Name Feb 4, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 032239/0511 →
Change of Name Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →