Patent Assignment
Reel/Frame 015943/0636
Assignment of Assignor's Interest
Recorded: 2004-10-28
Pages: 2
Assignor
HAMADA, HIDEKI
Executed: 2004-10-14
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA 211-8668, JAPAN
Covered Property
(1)
Scan Test Method, Integrated Circuit, and Scan Test Circuit
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.