IP Library Assignment 015988/0352
Patent Assignment
Reel/Frame 015988/0352

Assignment of Assignor's Interest

Recorded: 2004-11-12 Pages: 2
Assignors
MAKI, TANAKA
Executed: 2004-07-23
CHIE, SHISHIDO
Executed: 2004-07-30
MOROKUMA, HIDETOSHI
Executed: 2004-07-26
TAKAGI, YUJI
Executed: 2004-08-02
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Apparatus for Inspecting Three Dimensional Shape of a Specimen and Method of Watching an Etching Process Using the Same
Patent: 7,230,239 →
Application: 10/918,381 →
Publication: US 2005/0048780
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Corrective Assignment to Correct Conveying Party, Previously Recorded at Reel 015988, Frame 0352. Nov 4, 2005
From: TANAKA, MAKI; SHISHIDO, CHIE; MOROKUMA, HIDETOSHI; TAKAGI, YUJI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 017185/0582 →
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →