IP Library Assignment 017185/0582
Patent Assignment
Reel/Frame 017185/0582

Corrective Assignment to Correct Conveying Party, Previously Recorded at Reel 015988, Frame 0352.

Recorded: 2005-11-04 Pages: 5
Assignors
TANAKA, MAKI
Executed: 2004-07-23
SHISHIDO, CHIE
Executed: 2004-07-26
MOROKUMA, HIDETOSHI
Executed: 2004-07-30
TAKAGI, YUJI
Executed: 2004-08-02
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Apparatus for Inspecting Three Dimensional Shape of a Specimen and Method of Watching an Etching Process Using the Same
Patent: 7,230,239 →
Application: 10/918,381 →
Publication: US 2005/0048780
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Nov 12, 2004
From: MAKI, TANAKA; CHIE, SHISHIDO; MOROKUMA, HIDETOSHI; TAKAGI, YUJI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 015988/0352 →
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →