Assignment of Assignor's Interest

Recorded: 2004-12-02 Pages: 3

Assignor

TAMURA, KOICHI

Executed: 2004-11-12

Assignee

SII NANO TECHNOLOGY INC.

8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN

Covered Property (1)

Fluorescent X-Ray Analysis Apparatus

Patent: 6,850,593 →

Application: 09/531,660 →

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.