Fluorescent X-ray analysis apparatus
View Patent ↗In a fluorescent X-ray analysis apparatus, a diffraction X-ray is removable from a sample even if it is formed of a mixture of fine crystals. A movable collimator mechanism capable of detecting only a collimate component of an X-ray optical flux is provided in a secondary X-ray path extending between a sample and an X-ray detector. Spectrum measurement is conducted on the same sample when the collimator mechanism is inserted and removed from the secondary X-ray path.
1. A fluorescent X-ray analysis apparatus comprising:
an X-ray source for generating a primary X-ray;
a sample table for fixing a sample to be radiated by the primary X-ray;
a detector for detecting a secondary X-ray produced by the sample in response to irradiation by the primary X-ray; and
a collimator mechanism removably insertable in an X-ray path between the sample and the detector for passing a secondary X-ray component having a uniform extraction angle and reducing a secondary X-ray component having a non-uniform extraction angle, the extraction angle being defined between a first line connecting an intersection of a center line of an x-ray optical flux radiated by the X-ray source with a plane of the sample table and a second line connecting a center point of a detection region of the detector with a plane of the sample table.
2. A fluorescent X-ray analysis apparatus according to claim 1 ; wherein the collimator mechanism comprises a parallel plate collimator having a plurality of metal thin sheets arranged in parallel and spaced apart by a small interval.
3. A fluorescent X-ray analysis apparatus according to claim 1 ; wherein the collimator mechanism comprises a poly-capillary bundled with metal or glass hollow tubes.
4. A fluorescent X-ray analysis apparatus according to claim 1 ; wherein the collimator mechanism comprises two parallel plate collimators arranged perpendicularly to each other along a path of the secondary X-ray, each plate collimator having a plurality of metal thin sheets arranged in parallel and spaced apart by a small interval.
5. A method of performing X-ray analysis comprising the steps of:
irradiating a sample with a primary X-ray;
obtaining a first spectrum by measuring a secondary X-ray emanating from the sample in response to irradiation of the sample by the primary X-ray;
inserting a collimator in a path of the secondary X-ray to allow a collimate component of the secondary X-ray to pass therethrough;
obtaining a second spectrum by measuring the secondary X-ray emanating from the sample in response to irradiation of the sample by the primary X-ray while the collimator is interposed in the path of the secondary X-ray; and
performing an arithmetic process on the first and second spectrums to remove a diffraction X-ray peak.