IP Library › Assignment 016072/0417
Patent Assignment
Reel/Frame 016072/0417

Assignment of Assignor's Interest

Recorded: 2004-12-08 Pages: 3
Assignors
ONO, YASUKAZU
Executed: 2004-11-12
YAKURA, MOTOHARU
Executed: 2004-11-12
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property (1)
Method for Manufacturing Probe Needle, Method for Manufacturing Probe Card, and Probe Card
Patent: 7,150,095 →
Application: 11/006,762 →
Publication: US 2006/0042077
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 9, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0089 →
Change of Name Jul 9, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024651/0744 →
Assignment of Assignor's Interest Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035508/0469 →