IP Library Assignment 016118/0479
Patent Assignment
Reel/Frame 016118/0479

Assignment of Assignor's Interest

Recorded: 2004-12-22 Pages: 3
Assignors
MAZOR, ISAAC
Executed: 2004-12-15
YOKHIN, BORIS
Executed: 2004-11-29
Assignee
JORDAN VALLEY APPLIED RADIATION LTD.
P.O. BOX 103, MIGDAL HA'EMEK, ISRAEL
Covered Property (1)
Measurement of Critical Dimensions Using X-Ray Diffraction in Reflection Mode
Patent: 7,110,491 →
Application: 11/018,352 →
Publication: US 2006/0133570
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jan 10, 2010
From: JORDAN VALLEY APPLIED RADIATION LTD
To: JORDAN VALLEY SEMICONDUCTORS LTD
Reel/Frame 023750/0885 →
Change of Name Apr 13, 2021
From: JORDAN VALLEY SEMICONDUCTORS LTD.
To: BRUKER TECHNOLOGIES LTD.
Reel/Frame 056004/0248 →