Patent Assignment
Reel/Frame 023750/0885
Change of Name
Recorded: 2010-01-10
Pages: 6
Assignor
JORDAN VALLEY APPLIED RADIATION LTD
Executed: 2004-11-11
Assignee
JORDAN VALLEY SEMICONDUCTORS LTD
P.O. BOX 103, MIGDAL HAEMEK, 23100, ISRAEL
Covered Properties
(32)
X-Ray Fluorescence Analyzer
Patent:
6,041,095 →
Application:
09/028,588 →
Contamination and Residuals Inspection System
Patent:
6,184,686 →
Application:
09/114,462 →
Plasma Spectrometer with Shutter Assembly
Patent:
5,946,089 →
Application:
09/114,603 →
X-Ray Microfluorescence Analyzer
Patent:
6,108,398 →
Application:
09/114,789 →
X-Ray Microanalyzer for Thin Films
Patent:
6,381,303 →
Application:
09/408,894 →
X-Ray Array Detector
Detection of Voids in Semiconductor Wafer Processing
Patent:
6,351,516 →
Application:
09/461,670 →
Differential Measurement of X-Ray Microfluorescence
Patent:
6,453,002 →
Application:
09/551,715 →
Measurement of Critical Dimensions Using X-Rays
Patent:
6,556,652 →
Application:
09/635,212 →
X-Ray Reflectometer
Pulsed X-Ray Reflectometer
Dual-Wavelength X-Ray Reflectometry
X-Ray Reflectometer
Beam Centering and Angle Calibration for X-Ray Reflectometry
X-Ray Reflectometry with Small-Angle Scattering Measurement
X-Ray Reflectometer
Optical Alignment of X-Ray Microanalyzers
X-Ray Reflectometry of Thin Film Layers with Enhanced Accuracy
X-Ray Scattering with a Polychromatic Source
Dual-Wavelength X-Ray Monochromator
Enhancement of X-Ray Reflectometry by Measurement of Diffuse Reflections
Combined X-Ray Reflectometer and Diffractometer
Calibration of X-Ray Reflectometry System
X-Ray Apparatus with Dual Monochromators
Measurement of Critical Dimensions Using X-Ray Diffraction in Reflection Mode
Material Analysis Using Multiple X-Ray Reflectometry Models
Detection of Dishing and Tilting Using X-Ray Fluorescence
Enhancing Resolution of X-Ray Measurements by Sample Motion
Patent:
7,113,566 →
Application:
11/181,746 →
X-Ray Reflectometry of Thin Film Layers with Enhanced Accuracy
Overlay Metrology Using X-Rays
Efficient Measurement of Diffuse X-Ray Reflections
Measurement of Properties of Thin Films on Sidewalls
Related Assignments
(23)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jun 22, 1998
From: YOKHIN, BORIS
To: JORDAN VALLEY APPLIED RADIATION
Reel/Frame 009265/0390 →
Assignment of Assignor's Interest
Jul 13, 1998
From: DUER, REUVEN
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 009318/0093 →
Assignment of Assignor's Interest
Nov 2, 1998
From: MAZOR, ISAAC; GVIRTZMAN, AMOS; YOKHIN, BORIS
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 009567/0397 →
Assignment of Assignor's Interest
Nov 5, 1998
From: MAZOR, ISAAC; GVIRTZMAN, AMOS; DUER, REUVEN
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 009563/0910 →
Assignment of Assignor's Interest
Nov 23, 1999
From: VU, LONG; YOKHIN, BORIS; MAZOR, ISAAC; GVIRTZMAN, AMOS
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 010678/0716 →
Assignment of Assignor's Interest
Nov 30, 1999
From: MAZOR, ISAAC; GVIRTZMAN, AMOS; YOKHIN, BORIS; DOVRAT, AMI
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 010407/0194 →
Assignment of Assignor's Interest
Feb 22, 2000
From: MAZOR, ISAAC; VU, LONG
To: JORDAN VALLEY APPLIED RADIATION, LTD.
Reel/Frame 010563/0264 →
Assignment of Assignor's Interest
Apr 18, 2000
From: MAZOR, ISAAC; HOKHIN, BORIS; BAR-ON, DAVID
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 010739/0278 →
Assignment of Assignor's Interest
Dec 8, 2000
From: MAZOR, ISAAC; YOKHIN, BORIS; GVIRTZMAN, AMOS
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 011309/0331 →
Assignment of Assignor's Interest
Apr 12, 2001
From: YOKHIN, BORIS; DIKOPOLTSEV, ALEXANDER; MAZOR, ISAAC; BERMAN, DAVID
To: JORDAN VALLEY APPLIED RADIATION, LTD.
Reel/Frame 011697/0972 →
Assignment of Assignor's Interest
Feb 14, 2002
From: YOKHIN, BORIS
To: JORDAN VALLEY APPLIED RADIATION, LTD.
Reel/Frame 012609/0539 →
Assignment of Assignor's Interest
Feb 19, 2002
From: YOKHIN, BORIS; MAZOR, ISAAC; GVIRTZMAN, AMOS
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 012618/0176 →
Assignment of Assignor's Interest
Dec 6, 2002
From: YOKHIN, BORIS; MAZOR, ISAAC; BERMAN, DAVID
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 013560/0897 →
Assignment of Assignor's Interest
Feb 12, 2003
From: YOKHIN, BORIS; DIKOPOLTSEV, ALEXANDER; RAFAELI, TZACHI; GVIRTZMAN, AMOS
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 013773/0247 →
Re-Recorded to Correct Assignee's Address on an Assignment Document Previouly Recorded at Reel 013560 Frame 0897.
May 19, 2003
From: YOKHIN, BORIS; MAZOR, ISAAC; BERMAN, DAVID
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 014076/0913 →
Assignment of Assignor's Interest
Sep 29, 2003
From: RAFAELI, TZACHI; MAZOR, ISAAC
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 014568/0353 →
Assignment of Assignor's Interest
Nov 5, 2003
From: YOKHIN, BORIS
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 014678/0989 →
Assignment of Assignor's Interest
Jan 15, 2004
From: BERMAN, DAVID; DIKOPOLTSEV, ALEX
To: JORDAN VALLEY APPLIED RADIATION, LTD.
Reel/Frame 014941/0747 →
Assignment of Assignor's Interest
Dec 6, 2005
From: AGNIHOTRI, DILEEP
To: JORDON VALLEY APPLIED RADIATION LTD.
Reel/Frame 017091/0505 →
Assignment of Assignor's Interest
Nov 22, 2009
From: YOKHIN, BORIS; DIKOPOLTSEV, ALEXANDER; MAZOR, ISAAC; BERMAN, DAVID
To: JORDAN VALLEY APPLIED RADIATION LTD
Reel/Frame 023546/0885 →
Assignment of Assignor's Interest
Nov 22, 2009
From: YOKHIN, BORIS; DIKOPOLTSEV, ALEXANDER; MAZOR, ISAAC; BERMAN, DAVID
To: JORDAN VALLEY APPLIED RADIATION LTD
Reel/Frame 023546/0881 →
Assignment of Assignor's Interest
Nov 22, 2009
From: YOKHIN, BORIS; MAZOR, ISAAC; GVIRTZMAN, AMOS
To: JORDAN VALLEY APPLIED RADIATION LTD
Reel/Frame 023546/0874 →
Change of Name
Apr 13, 2021
From: JORDAN VALLEY SEMICONDUCTORS LTD.
To: BRUKER TECHNOLOGIES LTD.
Reel/Frame 056004/0248 →