IP Library › Assignment 017091/0505
Patent Assignment
Reel/Frame 017091/0505

Assignment of Assignor's Interest

Recorded: 2005-12-06 Pages: 3
Assignor
AGNIHOTRI, DILEEP
Executed: 2005-10-20
Assignee
JORDON VALLEY APPLIED RADIATION LTD.
P.O. BOX 103, MIGDAL HAEMEK, 23100, ISRAEL
Covered Property (1)
X-Ray Reflectometry of Thin Film Layers with Enhanced Accuracy
Patent: 7,062,013 →
Application: 10/689,314 →
Publication: US 2004/0131151
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 15, 2004
From: BERMAN, DAVID; DIKOPOLTSEV, ALEX
To: JORDAN VALLEY APPLIED RADIATION, LTD.
Reel/Frame 014941/0747 →
Change of Name Jan 10, 2010
From: JORDAN VALLEY APPLIED RADIATION LTD
To: JORDAN VALLEY SEMICONDUCTORS LTD
Reel/Frame 023750/0885 →
Change of Name Apr 13, 2021
From: JORDAN VALLEY SEMICONDUCTORS LTD.
To: BRUKER TECHNOLOGIES LTD.
Reel/Frame 056004/0248 →