IP Library Assignment 056004/0248
Patent Assignment
Reel/Frame 056004/0248

Change of Name

Recorded: 2021-04-13 Pages: 8
Assignor
JORDAN VALLEY SEMICONDUCTORS LTD.
Executed: 2019-07-18
Assignee
BRUKER TECHNOLOGIES LTD.
6 HAMECHKAR STREET, P.O. BOX 103, MIGDAL HAEMEK, 2306990, ISRAEL
Covered Properties (34)
X-Ray Reflectometer
Patent: 6,512,814 →
Application: 09/833,902 →
Publication: US 2002/0150208
Method and Apparatus for Prolonging the Life of an X-Ray Target
Patent: 6,778,633 →
Application: 09/937,609 →
X-Ray Topographic System
Patent: 6,782,076 →
Application: 10/004,785 →
Publication: US 2003/0108152
Pulsed X-Ray Reflectometer
Patent: 6,535,575 →
Application: 10/077,125 →
Publication: US 2002/0150209
Dual-Wavelength X-Ray Reflectometry
Patent: 6,680,996 →
Application: 10/078,640 →
Publication: US 2003/0156682
X-Ray Reflectometer
Patent: 6,639,968 →
Application: 10/300,504 →
Publication: US 2003/0072413
Beam Centering and Angle Calibration for X-Ray Reflectometry
Patent: 6,947,520 →
Application: 10/313,280 →
Publication: US 2004/0109531
X-Ray Reflectometry with Small-Angle Scattering Measurement
Patent: 6,895,075 →
Application: 10/364,883 →
Publication: US 2004/0156474
Multi-Foil Optic
Patent: 6,881,965 →
Application: 10/627,863 →
Publication: US 2004/0089818
X-Ray Reflectometer
Patent: 6,895,071 →
Application: 10/635,365 →
Publication: US 2004/0028186
Optical Alignment of X-Ray Microanalyzers
Patent: 7,023,954 →
Application: 10/673,996 →
Publication: US 2005/0069090
X-Ray Reflectometry of Thin Film Layers with Enhanced Accuracy
Patent: 7,062,013 →
Application: 10/689,314 →
Publication: US 2004/0131151
X-Ray Scattering with a Polychromatic Source
Patent: 7,035,375 →
Application: 10/702,413 →
Publication: US 2005/0094766
Dual-Wavelength X-Ray Monochromator
Patent: 6,907,108 →
Application: 10/761,023 →
Publication: US 2004/0151278
Enhancement of X-Ray Reflectometry by Measurement of Diffuse Reflections
Patent: 7,068,753 →
Application: 10/902,177 →
Publication: US 2006/0023836
Combined X-Ray Reflectometer and Diffractometer
Patent: 7,120,228 →
Application: 10/946,426 →
Publication: US 2006/0062350
Calibration of X-Ray Reflectometry System
Patent: 7,474,732 →
Application: 11/000,044 →
Publication: US 2006/0115046
X-Ray Apparatus with Dual Monochromators
Patent: 7,076,024 →
Application: 11/000,053 →
Publication: US 2006/0115047
Measurement of Critical Dimensions Using X-Ray Diffraction in Reflection Mode
Patent: 7,110,491 →
Application: 11/018,352 →
Publication: US 2006/0133570
Material Analysis Using Multiple X-Ray Reflectometry Models
Patent: 7,103,142 →
Application: 11/065,737 →
Publication: US 2006/0188062
Detection of Dishing and Tilting Using X-Ray Fluorescence
Patent: 7,245,695 →
Application: 11/103,071 →
Publication: US 2006/0227931
Enhancing Resolution of X-Ray Measurements by Sample Motion
Patent: 7,113,566 →
Application: 11/181,746 →
Multifunction X-Ray Analysis System
Patent: 7,551,719 →
Application: 11/200,857 →
Publication: US 2006/0062351
X-Ray Reflectometry of Thin Film Layers with Enhanced Accuracy
Patent: 7,130,376 →
Application: 11/297,837 →
Publication: US 2006/0153333
Overlay Metrology Using X-Rays
Patent: 7,481,579 →
Application: 11/389,490 →
Publication: US 2007/0224518
Efficient Measurement of Diffuse X-Ray Reflections
Patent: 7,231,016 →
Application: 11/396,719 →
Publication: US 2006/0182220
Measurement of Properties of Thin Films on Sidewalls
Patent: 7,483,513 →
Application: 11/487,433 →
Publication: US 2006/0274886
Control of X-Ray Beam Spot Size
Patent: 7,406,153 →
Application: 11/503,979 →
Publication: US 2008/0043911
Control of X-Ray Beam Spot Size
Patent: 7,453,985 →
Application: 11/822,231 →
Publication: US 2008/0043914
Target Alignment for X-Ray Scattering Measurements
Patent: 7,600,916 →
Application: 11/892,005 →
Publication: US 2007/0286344
X-Ray Measurement of Properties of Nano-Particles
Patent: 7,680,243 →
Application: 11/896,909 →
Publication: US 2009/0067573
Inspection of Small Features Using X-Ray Fluorescence
Patent: 7,653,174 →
Application: 12/003,215 →
Publication: US 2008/0159475
Automated Selection of X-Ray Reflectometry Measurement Locations
Patent: 7,649,978 →
Application: 12/232,259 →
Publication: US 2009/0074141
Accurate Measurement of Layer Dimensions Using Xrf
Patent: 7,804,934 →
Application: 12/272,050 →
Publication: US 2009/0074137
Related Assignments (21)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 12, 2001
From: YOKHIN, BORIS; DIKOPOLTSEV, ALEXANDER; MAZOR, ISAAC; BERMAN, DAVID
To: JORDAN VALLEY APPLIED RADIATION, LTD.
Reel/Frame 011697/0972 →
Assignment of Assignor's Interest Jan 28, 2002
From: LOXLEY, NEIL; TAYLOR, MARK; WALL, JOHN LEONARD; FRASER, GRAHAM VINCENT
To: BEDE SCIENTIFIC INSTRUMENTS LIMITED
Reel/Frame 012587/0862 →
Assignment of Assignor's Interest Feb 14, 2002
From: YOKHIN, BORIS
To: JORDAN VALLEY APPLIED RADIATION, LTD.
Reel/Frame 012609/0539 →
Assignment of Assignor's Interest Feb 19, 2002
From: YOKHIN, BORIS; MAZOR, ISAAC; GVIRTZMAN, AMOS
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 012618/0176 →
Assignment of Assignor's Interest Apr 2, 2002
From: BOWEN, DAVID KEITH; WORMINGTON, MATTHEW; PINA, LADISLAV; FEICHTINGER, PETRA
To: BEDE SCIENTIFIC INSTRUMENTS LIMITED
Reel/Frame 012751/0990 →
Assignment of Assignor's Interest Dec 6, 2002
From: YOKHIN, BORIS; MAZOR, ISAAC; BERMAN, DAVID
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 013560/0897 →
Assignment of Assignor's Interest Feb 12, 2003
From: YOKHIN, BORIS; DIKOPOLTSEV, ALEXANDER; RAFAELI, TZACHI; GVIRTZMAN, AMOS
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 013773/0247 →
Re-Recorded to Correct Assignee's Address on an Assignment Document Previouly Recorded at Reel 013560 Frame 0897. May 19, 2003
From: YOKHIN, BORIS; MAZOR, ISAAC; BERMAN, DAVID
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 014076/0913 →
Assignment of Assignor's Interest Sep 29, 2003
From: RAFAELI, TZACHI; MAZOR, ISAAC
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 014568/0353 →
Assignment of Assignor's Interest Nov 5, 2003
From: YOKHIN, BORIS
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 014678/0989 →
Assignment of Assignor's Interest Dec 23, 2003
From: BOWEN, DAVID KEITH; PINA, LADISLAV; INNEMAN ADOLF; HUDEC, RENE
To: BEDE SCIENTIFIC INSTRUMENTS LTD.
Reel/Frame 014832/0098 →
Assignment of Assignor's Interest Jan 15, 2004
From: BERMAN, DAVID; DIKOPOLTSEV, ALEX
To: JORDAN VALLEY APPLIED RADIATION, LTD.
Reel/Frame 014941/0747 →
Assignment of Assignor's Interest Jul 30, 2004
From: BERMAN, DAVID; MAZOR, ISAAC; YOKHIN, BORIS; GVIRTZMAN, AMOS
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 015643/0579 →
Assignment of Assignor's Interest Dec 1, 2004
From: BERMAN, DAVID; PELED, ASHER; AGNIHOTRI, DILEEP; RAFAELI, TZACHI
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 016049/0713 →
Assignment of Assignor's Interest Dec 28, 2004
From: YOKHIN, BORIS; MAZOR, ISAAC; RAFAELI, TZACHI
To: JORDAN VALLEY APPLIED RADIATION LTD.
Reel/Frame 015504/0114 →
Assignment of Assignor's Interest Dec 6, 2005
From: AGNIHOTRI, DILEEP
To: JORDON VALLEY APPLIED RADIATION LTD.
Reel/Frame 017091/0505 →
Assignment of Assignor's Interest Sep 28, 2008
From: BEDE SCIENTIFIC INSTRUMENTS LIMITED
To: JORDAN VALLEY SEMICONDUCTORS LIMITED
Reel/Frame 021590/0376 →
Assignment of Assignor's Interest Nov 22, 2009
From: YOKHIN, BORIS; MAZOR, ISAAC; GVIRTZMAN, AMOS
To: JORDAN VALLEY APPLIED RADIATION LTD
Reel/Frame 023546/0874 →
Assignment of Assignor's Interest Nov 22, 2009
From: YOKHIN, BORIS; DIKOPOLTSEV, ALEXANDER; MAZOR, ISAAC; BERMAN, DAVID
To: JORDAN VALLEY APPLIED RADIATION LTD
Reel/Frame 023546/0885 →
Assignment of Assignor's Interest Nov 22, 2009
From: YOKHIN, BORIS; DIKOPOLTSEV, ALEXANDER; MAZOR, ISAAC; BERMAN, DAVID
To: JORDAN VALLEY APPLIED RADIATION LTD
Reel/Frame 023546/0881 →
Change of Name Jan 10, 2010
From: JORDAN VALLEY APPLIED RADIATION LTD
To: JORDAN VALLEY SEMICONDUCTORS LTD
Reel/Frame 023750/0885 →