Efficient measurement of diffuse X-ray reflections
A method for inspection of a sample having a surface layer. The method includes acquiring a first reflectance spectrum of the sample while irradiating the sample with a collimated beam of X-rays, and processing the first reflectance spectrum to measure a diffuse reflection property of the sample. A second reflectance spectrum of the sample is acquired while irradiating the sample with a converging beam of the X-rays. The second reflectance spectrum is analyzed using the diffuse reflection property so as to determine a characteristic of the surface layer of the sample.
1. A method for inspection of a sample, comprising:
irradiating the sample with a collimated beam of X-rays at a predetermined incidence angle;
receiving the X-rays reflected from the sample over a range of elevation angles simultaneously using a detector array; and
processing an output of the detector array so as to measure a diffuse reflection property of the sample and providing a signal indicative of the output.
2. The method according to claim 1 , wherein processing the output comprises detecting a Yoneda wing in a reflectance spectrum of the sample.
3. The method according to claim 2 , wherein detecting the Yoneda wing comprises determining a critical angle for total external reflection from the sample responsively to an angular location of the Yoneda wing.
4. The method according to claim 2 , wherein detecting the Yoneda wing comprises determining a measure of roughness of the surface layer responsively to an amplitude of the Yoneda wing.
5. The method according to claim 1 , wherein the sample comprises a semiconductor wafer, and wherein processing the output comprises determining a quality of a thin film layer formed on the wafer.
6. The method according to claim 1 , wherein irradiating the sample comprises collimating the beam of X-rays by passing the X-rays through a slit.
7. The method according to claim 6 , wherein passing the X-rays through the slit comprises setting a width of the slit responsively to a desired measurement throughput.
8. The method according to claim 6 , wherein passing the X-rays through the slit comprises setting a width of the slit responsively to a desired measurement accuracy.
9. Apparatus for inspection of a sample, comprising:
a radiation source, which is adapted to direct a collimated beam of X-rays toward the sample at a predetermined incidence angle;
a detector array, which is arranged to receive the X-rays reflected from the sample over a range of elevation angles simultaneously and to generate an output responsively to the received X-rays; and
a signal processor, which is coupled to receive and process the output of the detector array so as to measure a diffuse reflection property of the sample.
10. The apparatus according to claim 9 wherein the signal processor is adapted to process the output so as to detect a Yoneda wing in a reflectance spectrum of the sample.
11. The apparatus according to claim 10 , wherein the signal processor is adapted to determine a critical angle for total external reflection from the sample responsively to an angular location of the Yoneda wing.
12. The apparatus according to claim 10 , wherein the signal processor is adapted to determine a measure of roughness of the surface layer responsively to an amplitude of the Yoneda wing.
13. The apparatus according to claim 9 , wherein the sample comprises a semiconductor wafer, and wherein the signal processor is adapted to process the output so as to determine a quality of a thin film layer formed on the wafer.
14. The apparatus according to claim 9 , wherein the radiation source comprises a slit, which is arranged to collimate the beam of X-rays.
15. The apparatus according to claim 14 , wherein the width of the slit is set responsively to a desired measurement throughput of the apparatus.
16. The apparatus according to claim 14 , wherein the width of the slit is set responsively to a desired measurement accuracy.