IP Library Assignment 016139/0875
Patent Assignment
Reel/Frame 016139/0875

Assignment of Assignor's Interest

Recorded: 2004-12-30 Pages: 3
Assignor
LEE, SANG YONG
Executed: 2004-12-22
Assignee
DONGBUANAM SEMICONDUCTOR INC.
891-10, DAECHI-DONG, KANGNAM-KU, SOEUL, KOREA, REPUBLIC OF
Covered Property (1)
Forming Method of Gate Insulating Layer and Nitrogen Density Measuring Method Thereof
Patent: 7,348,282 →
Application: 11/024,849 →
Publication: US 2005/0142816
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name May 23, 2006
From: DONGBU-ANAM SEMICONDUCTOR, INC.
To: DONGBU ELECTRONICS CO., LTD.
Reel/Frame 017663/0468 →