Patent Assignment
Reel/Frame 016151/0818
Assignment of Assignor's Interest
Recorded: 2004-12-29
Pages: 3
Assignor
LEE, BYEONG RYEOL
Executed: 2004-12-29
Assignee
DONGBUANAM SEMICONDUCTOR, INC.
891-10 DAECHI-DONG, KANGNAM-KU, SEOUL 135-523, KOREA, REPUBLIC OF
Covered Property
(1)
Method of Fabricating a Test Pattern for Junction Leakage Current
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.