Patent Assignment
Reel/Frame 016299/0116
Assignment of Assignor's Interest
Recorded: 2005-02-27
Pages: 3
Assignor
TAMURA, KOICHI
Executed: 2005-02-21
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Apparatus and Method for Measuring Thickness and Composition of Multi-Layered Sample
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.