Apparatus and method for measuring thickness and composition of multi-layered sample

1. An apparatus for measuring the thickness and composition of a multi-layered sample, the apparatus comprising:

an X-ray generator for generating primary X-rays;

a sample holder for supporting a sample having a tin-copper alloy plating layer disposed on a film comprised of one or more layers including at least a copper layer;

a collimator for focusing primary X-rays generated by the X-ray generator and allowing part of a luminous flux of the primary X-rays to irradiate onto a microscopic area of the sample so that fluorescent X-rays and diffracted X-rays are emitted from the sample;

an energy-dispersive X-ray detector for detecting the fluorescent X-rays and diffracted X-rays emitted from the sample; and

means for generating an X-ray spectrum of the fluorescent X-rays and diffracted X-rays detected by the energy-dispersive X-ray detector, measuring the concentration of copper in the tin-copper alloy plating layer of the sample using peak intensities of the diffracted X-rays in the X-ray spectrum, and measuring the thickness of the tin-copper alloy plating layer of the sample using peak intensities of the fluorescent X-rays in the X-ray spectrum and the measured concentration of copper.

2. An apparatus for measuring the thickness and composition of a multi-layered sample, the apparatus comprising:

an X-ray generator for generating primary X-rays;

a sample holder for supporting a sample comprised of a tin-copper alloy plating layer disposed on a film having one or more layers including at least a copper layer;

a collimator for focusing primary X-rays generated by the X-ray generator and allowing part of a luminous flux of the primary X-rays to irradiate onto a microscopic area of the sample so that fluorescent X-rays and diffracted X-rays are emitted from the sample;

an energy-dispersive X-ray detector for detecting the fluorescent X-rays and diffracted X-rays emitted from the sample; and

means for generating an X-ray spectrum of the fluorescent X-rays and diffracted X-rays detected by the energy-dispersive X-ray detector, for measuring the concentration of copper in the tin-copper alloy plating layer of the sample using peak intensities of the diffracted X-rays in the X-ray spectrum, for measuring the thickness of the tin-copper alloy plating layer of the sample using peak intensities of the fluorescent X-rays in the X-ray spectrum and the measured concentration of copper, and for measuring the concentration of elements and the thickness of one or more of the film layers of the sample in accordance with the X-ray spectrum.

3. An apparatus according to claim 1 ; wherein the tin-copper alloy plating layer contains ten percent or less copper by weight.

4. An apparatus according to claim 2 ; wherein the tin-copper alloy plating layer contains ten percent or less copper by weight.

5. An apparatus for determining the thickness and composition of a multi-layered sample, the apparatus comprising:

an X-ray generator for generating primary X-rays;

sample holding means for holding a multi-layered sample at a position such that the sample will be irradiated by the primary X-rays generated by the X-ray generator, the sample having at least a copper layer and a tin-copper alloy plating layer disposed on the copper layer;

an energy-dispersive X-ray detector for detecting fluorescent X-rays and diffracted X-rays emitted from the sample when the sample is irradiated by the primary X-rays generated by the X-ray generator;

generating means for generating an X-ray spectrum of the fluorescent X-rays and diffracted X-rays detected by the energy-dispersive X-ray detector;

concentration determining means for determining the concentration of copper in the tin-copper alloy plating layer of the sample utilizing peak intensities of the diffracted X-rays in the X-ray spectrum; and

thickness determining means for determining the thickness of the tin-copper alloy plating layer of the sample utilizing peak intensities of the fluorescent X-rays in the X-ray spectrum and the concentration of copper determined by the concentration determining means.

6. An apparatus according to claim 5 ; wherein the tin-copper alloy plating layer of the sample contains ten percent or less copper by weight.

7. An apparatus according to claim 5 ; wherein the sample has a multi-layered film including the copper layer, the tin-copper alloy plating layer being disposed on the multi-layered film.

8. An apparatus according to claim 5 ; wherein the generating means comprises a central processing unit for generating spectral information of the fluorescent X-rays and diffracted X-rays and a display unit for displaying the spectral information as the X-ray spectrum.

9. A method for determining the thickness and composition of a multi-layered sample, the method comprising the steps of:

providing a sample comprised of at least a copper layer and a tin-copper alloy plating layer disposed on the copper layer;

irradiating the sample with primary X-rays;

detecting fluorescent X-rays and diffracted X-rays emitted from the sample due to irradiation of the sample with the primary X-rays;

generating an X-ray spectrum of the detected fluorescent X-rays and diffracted X-rays;

determining the concentration of copper in the tin-copper alloy plating layer of the sample utilizing peak intensities of the diffracted X-rays in the X-ray spectrum; and

determining the thickness of the tin-copper alloy plating layer of the sample utilizing peak intensities of the fluorescent X-rays in the X-ray spectrum and the determined copper concentration.

10. A method according to claim 9 ; wherein the tin-copper alloy plating layer of the sample contains ten percent or less copper by weight.

11. A method according to claim 9 ; wherein the sample comprises a multi-layered film including the copper layer, the tin-copper alloy plating layer being disposed on the multi-layered film.

12. A method according to claim 9 ; wherein the generating step includes the steps of generating spectral information of the fluorescent X-rays and diffracted X-rays and displaying the spectral information as the X-ray spectrum.