IP Library Assignment 016317/0942
Patent Assignment
Reel/Frame 016317/0942

Assignment of Assignor's Interest

Recorded: 2005-02-23 Pages: 2
Assignors
YAMAMOTO, KOUICHI
Executed: 2005-01-19
OTSUKA, SHINOBU
Executed: 2005-01-19
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Control System and Method of Semiconductor Inspection System
Patent: 7,196,533 →
Application: 11/062,827 →
Publication: US 2005/0184749
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →