Patent Assignment
Reel/Frame 016455/0510
Assignment of Assignor's Interest
Recorded: 2005-04-05
Pages: 2
Assignor
HOWLAND, JR., WILLIAM H.
Executed: 2005-04-01
Assignee
SOLID STATE MEASUREMENTS, INC.
110 TECHNOLGOGY DRIVE, PITTSBURGH, PENNSYLVANIA, 15275
Covered Property
(1)
Method of Measuring Semiconductor Wafers with an Oxide Enhanced Probe
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.