Patent Assignment
Reel/Frame 016497/0242
Assignment of Assignor's Interest
Recorded: 2005-04-27
Pages: 2
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Scratch Repairing Processing Method and Scanning Probe Microscope (Spm) Used Therefor
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.