Patent Assignment
Reel/Frame 016601/0362
Assignment of Assignor's Interest
Recorded: 2005-05-25
Pages: 2
Assignors
YAMASHITA, MASATSUGU
Executed: 2005-04-26
KAWASE, KODO
Executed: 2005-04-26
TONOUCHI, MASAYOSHI
Executed: 2005-04-26
KIWA, TOSHIHIRO
Executed: 2005-04-26
NIKAWA, KIYOSHI
Executed: 2005-04-26
Assignees
RIKEN
2-1, HIROSAWA, WAKO-SHI, SAITAMA, 351-0198, JAPAN
NEC ELECTRONICS CORPORATION
1753, SHIMONUMABE NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Method and Apparatus for Diagnosing Fault in Semiconductor Device
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.