IP Library Assignment 016675/0106
Patent Assignment
Reel/Frame 016675/0106

Assignment of Assignor's Interest

Recorded: 2005-10-24 Pages: 7
Assignors
RAJSKI, JANUSZ
Executed: 2005-10-13
CHEN, GANG
Executed: 2005-10-13
KEIM, MARTIN
Executed: 2005-10-13
TAMARAPALLI, NAGESH
Executed: 2005-10-13
SHARMA, MANISH
Executed: 2005-10-13
TANG, HUAXING
Executed: 2005-10-13
Assignee
MENTOR GRAPHICS CORPORATION
8005 SW BOECKMAN ROAD, WILSONVILLE, OREGON, 97070-7777
Covered Properties (3)
Integrated Circuit Yield and Quality Analysis Methods and Systems
Application: 11/221,373 →
Publication: US 2006/0053357
Fault Dictionaries for Integrated Circuit Yield and Quality Analysis Methods and Systems
Patent: 7,987,442 →
Application: 11/221,394 →
Publication: US 2006/0066338
Determining and Analyzing Integrated Circuit Yield and Quality
Patent: 7,512,508 →
Application: 11/221,395 →
Publication: US 2006/0066339
Related Assignments (2)
Other recorded transfers of the patents in this record — the chain of ownership.
Merger and Change of Name Jun 29, 2021
From: MENTOR GRAPHICS CORPORATION; SIEMENS INDUSTRY SOFTWARE INC.
To: SIEMENS INDUSTRY SOFTWARE INC.
Reel/Frame 056702/0387 →
Merger and Change of Name Jun 29, 2021
From: MENTOR GRAPHICS CORPORATION; SIEMENS INDUSTRY SOFTWARE INC.
To: SIEMENS INDUSTRY SOFTWARE INC.
Reel/Frame 056713/0076 →