Patent Assignment
Reel/Frame 016744/0706
Assignment of Assignor's Interest
Recorded: 2005-07-05
Pages: 3
Assignors
TAKAHASHI, HIROSHI
Executed: 2005-05-12
SHIRAKAWABE, YOSHIHARU
Executed: 2005-05-12
ARAI, TADASHI
Executed: 2005-05-12
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Heated Self-Detecting Type Cantilever for Atomic Force Microscope
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.