IP Library Granted Patent US 6,932,504
Granted Patent B2
US 6,932,504 · App. 10/395,683 · Granted Aug 23, 2005

Heated self-detecting type cantilever for atomic force microscope

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Quick Facts
Patent No.
US 6,932,504
App. No.
10/395,683
Granted
Aug 23, 2005
Kind
B2
Abstract

A self-detecting type cantilever for an atomic force microscope (AFM) has an electro-flexural conversion element for converting a flexural amount of the cantilever into an electric current or voltage, a temperature measurement element disposed at a front end portion of the cantilever for measuring a temperature, and a heating element disposed at the front end portion of the cantilever for heating the temperature measurement element. The temperature measurement element and the heating element are superposed with each other on a main face of the cantilever via an electrical insulating layer. As a result, even if the amount of electric energy supplied to the heating element is reduced, it is possible to effectively supply an amount of heat necessary for measurement to the temperature measurement element. Therefore, by minimizing the heat to be supplied to a sample and the cantilever, the respondency of measurement is improved and temperature measurement can be performed with a high degree of accuracy.

Claims (9)

1. A self-detecting type cantilever for an atomic force microscope (AFM) comprising:

an electro-flexural conversion element for converting a flexural amount of the cantilever into an electric current or voltage;

a temperature measurement element disposed at a front end portion of the cantilever for measuring a temperature; and

a heating element disposed at the front end portion of the cantilever for heating the temperature measurement element;

wherein the temperature measurement element and the heating element are superposed with each other on a main face of the cantilever via an electrical insulating layer, and the temperature measurement element includes a pair of measurement elements provided so as to sandwich the heating element.

2. A self-detecting type cantilever according to claim 1 , wherein a distance from each of the pair of measurement elements to the heating element is the same.

3. A self-detecting type cantilever according to claim 1 , wherein the heating element comprises a metal film wire provided on the main face.

4. A self-detecting type cantilever according to claim 3 , wherein the electrical insulating layer is formed on the main face so as to cover the metal film wire.

5. A self-detecting type cantilever according to claim 4 , wherein the temperature measurement element comprises a thermoelectric couple comprised of a pair of metal film wires formed on the electrical insulating layer and having front end portions superposed with each other.

Assignments (2)
CHANGE OF NAME Recorded Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 5, 2005
From: TAKAHASHI, HIROSHI; SHIRAKAWABE, YOSHIHARU; ARAI, TADASHI
To: SII NANOTECHNOLOGY INC.
Reel/Frame 016744/0706 →