Patent Assignment
Reel/Frame 016823/0674
Assignment of Assignor's Interest
Recorded: 2005-07-13
Pages: 3
Assignee
ADVANCED MICRO DEVICES, INC.
5204 E. BEN WHITE BLVD., AUSTIN, TEXAS, 78741
Covered Property
(1)
Method and Apparatus for Classifying Faults Based on Wafer State Data and Sensor Tool Trace Data
Patent:
7,277,824 →
Application:
11/180,393 →
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.