IP Library Assignment 017005/0454
Patent Assignment
Reel/Frame 017005/0454

Assignment of Assignor's Interest

Recorded: 2005-09-20 Pages: 2
Assignor
KOJIMA, SHOJI
Executed: 2005-07-21
Assignee
ADVANTEST CORPORATION
32-1, ASAHI-CHO 1-CHOME, MERIMA-KU, TOKYO 179-0071, JAPAN
Covered Property (1)
Semiconductor Testing Apparatus and Method of Testing Semiconductor
Patent: 7,373,574 →
Application: 11/176,300 →
Publication: US 2006/0010360
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Re-Record to Correct Assignee's Address Previously Recorded R/F 01700/0454 Feb 16, 2006
From: KOJIMA, SHOJI
To: ADVANTEST CORPORATION
Reel/Frame 017263/0627 →
Change of Address Dec 18, 2018
From: ADVANTEST CORPORATION
To: ADVANTEST CORPORATION
Reel/Frame 047987/0626 →