IP Library › Assignment 017263/0627
Patent Assignment
Reel/Frame 017263/0627

Re-Record to Correct Assignee's Address Previously Recorded R/F 01700/0454

Recorded: 2006-02-16 Pages: 3
Assignor
KOJIMA, SHOJI
Executed: 2006-02-16
Assignee
ADVANTEST CORPORATION
32-1, ASAHI-CHO 1-CHOME, NERIMA-KU, TOKYO 179-0071, JAPAN
Covered Property (1)
Semiconductor Testing Apparatus and Method of Testing Semiconductor
Patent: 7,373,574 →
Application: 11/176,300 →
Publication: US 2006/0010360
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 20, 2005
From: KOJIMA, SHOJI
To: ADVANTEST CORPORATION
Reel/Frame 017005/0454 →
Change of Address Dec 18, 2018
From: ADVANTEST CORPORATION
To: ADVANTEST CORPORATION
Reel/Frame 047987/0626 →