Patent Assignment
Reel/Frame 017052/0191
Assignment of Assignor's Interest
Recorded: 2005-09-29
Pages: 2
Assignor
KONDOU, CHIAKI
Executed: 2005-09-15
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA 211-8668, JAPAN
Covered Property
(1)
Semiconductor Integrated Circuit and Burn-in Test Method Thereof
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.