IP Library › Assignment 017073/0302
Patent Assignment
Reel/Frame 017073/0302

Release of Security Interest

Recorded: 2006-01-27 Pages: 3
Assignor
BANK OF AMERICA, N. A.
Executed: 2005-01-27
Assignee
CERPROBE CORPORATION
600 S. ROCKFORD DRIVE, TEMPE, ARIZONA, 85281
Covered Properties (5)
Probe Card Apparatus
Patent: 5,521,518 →
Application: 07/775,914 →
High Density Probe Card for Testing Electrical Circuits
Patent: 5,382,898 →
Application: 07/947,935 →
Probe Card Assembly for High Density Integrated Circuits
Patent: 5,828,226 →
Application: 08/746,117 →
Probe Assembly and Method for Switchable Multi-Dut Testing of Integrated Circuit Wafers
Patent: 5,923,178 →
Application: 08/837,399 →
Method and Apparatus for Interfacing Between Automatic Wafer Probe Machines, Automatic Testers, and Probe Cards
Patent: 6,114,869 →
Application: 09/082,896 →
Related Assignments (2)
Other recorded transfers of the patents in this record — the chain of ownership.
Merger Feb 22, 2006
From: CERPROBE CORPORATION
To: K&S INTERCONNECT, INC.
Reel/Frame 017198/0487 →
Assignment of Assignor's Interest Apr 24, 2006
From: KULICKE AND SOFFA INDUSTRIES, INC.; K&S INTERCONNECT, INC.
To: SV PROBE PTE LTD.
Reel/Frame 017519/0082 →