Patent Assignment
Reel/Frame 017108/0411
Assignment of Assignor's Interest
Recorded: 2005-12-09
Pages: 3
Assignor
FURUKI, TSUTOMU
Executed: 2005-10-24
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Semiconductor Integrated Device for Preventing Breakdown and Degradation of a Gate Oxide Film Caused by Charge-Up in Manufacturing Steps Thereof, Design Method Thereof, Designing Apparatus Method Thereof, and Manufacturing Apparatus Thereof
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.