IP Library Assignment 017161/0871
Patent Assignment
Reel/Frame 017161/0871

Assignment of Assignor's Interest

Recorded: 2006-01-04 Pages: 3
Assignor
MATOBA, YOSHIKI
Executed: 2005-11-24
Assignee
SII NANO TECHNOLOGY INC.
8 NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
X-Ray Fluorescent Analysis Apparatus
Patent: 7,289,598 →
Application: 11/264,403 →
Publication: US 2006/0093085
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →