X-ray fluorescent analysis apparatus
View Patent ↗The change in the sample size and a change in background intensity due to the coexisting element are measured in real time to thereby automatically change a measurement time, the detection lower limit is kept constant, so that a fluorescent X-ray apparatus is provided that is capable of measuring every time in the same detection lower limit even in a case where there have existed a change in size of a sample, a change in sensitivity due to a difference in main ingredient, and a change of a magnitude in background due to an influence of a coexisting element.
1. A method being implemented in an X-ray fluorescent analysis apparatus for maintaining a lower detection limit at a constant level for respective analyses, comprising:
determining a reference intensity of background energy and a reference sensitivity by analyzing a reference sample with the X-ray fluorescent analysis apparatus, wherein the reference sample contains at least one reference element at a known concentration;
initiating an analysis on a sample using the X-ray fluorescent analysis apparatus;
determining an intensity of background energy and a sensitivity for the analysis during the analysis, based on their relative deviations from the reference intensity of background energy and the reference sensitivity;
determining a measurement time, given a requisite lower detection limit, using the determined intensity of background energy and sensitivity, wherein the measurement time is a function of the requisite lower detection limit and the determined intensity of background energy and sensitivity; and
proceeding with the analysis on the sample to conduct the analysis for a duration of the determined measurement time to thereby effect the requisite lower detection limit.
2. A method according to claim 1 , wherein determining the reference intensity of background energy comprises:
defining a function simulating a spectrum pattern exhibited by the reference sample; and
calculating an area along the function.
3. A method according to claim 1 , wherein the reference sample contains a reference element at a known concentration, and determining the reference sensitivity comprises determining the reference sensitivity, using the following equation:
Sensitivity
=
(
GrossIntensity
-
BackgroundInstensity
)
Concentration
where the gross intensity represents an intensity of peak energy at a spectral position of the reference element, the background intensity represents the reference intensity of background energy at the spectral position of the element and the concentration represents the known concentration of the element.
4. A method according to claim 2 , wherein the function for determining measurement time is defined by the following equation:
lowerDetectionLimit
=
3
×
BGIntensity
MeasurementTime
Sensitivity
.
where “Lower Detection Limit” represents the requisite lower detection limit, “BG Intensity” represents the determined intensity of background energy for the analysis, “Measurement Time” represents the measurement time, and “Sensitivity” represents the determined sensitivity for the analysis.
5. A method according to claim 4 , wherein the deviations are caused by at least one of a difference of the sample and a difference of operation parameters of the X-ray fluorescent analysis apparatus.
6. A method according to claim 5 , wherein the sample contains at least one other element which is not contained in the reference sample, and the at least one other element causes at least the intensity of background energy for the analysis to deviate from the reference intensity of background energy.
7. A method according to claim 5 , wherein the sample differs in size from the reference sample, and the difference in size causes both the intensity of background energy and sensitivity for the analysis to deviate from the reference intensity of background energy and sensitivity.
8. A method according to claim 5 , wherein the X-ray fluorescent analysis apparatus irradiates an X-ray onto the sample at an intensity which differs from one at which an X-ray is irradiated onto the reference sample, and the difference in irradiation intensity causes at least at least the sensitivity for the analysis to deviate from the reference sensitivity.