IP Library › Assignment 017316/0747
Patent Assignment
Reel/Frame 017316/0747

Assignment of Assignor's Interest

Recorded: 2005-12-02 Pages: 3
Assignors
FUJIHIRA, MASAMICHI
Executed: 2005-12-01
YASHUTAKE, MASATOSHI
Executed: 2005-12-01
ATAKA, TATSUAKI
Executed: 2005-12-01
Assignees
TOKYO INSTITUTE OF TECHNOLOGY
2-12-1, OOKAYAMA MEGURO-KU, TOKYO, JAPAN
SII NANOTECHNOLOGY INC.
8 NAKASE 1-CHOME,, MIHAMA-KU, CHIBA-SHI, CHIBA, JAPAN
Covered Property (1)
Probe Microscope System Suitable for Observing Sample of Long Body
Patent: 7,507,957 →
Application: 11/216,389 →
Publication: US 2006/0060778
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 14, 2008
From: TOKYO INSTITUTE OF TECHNOLOGY; SII NANOTECHNOLOGY INC.
To: SII NANOTECHNOLOGY INC.
Reel/Frame 021693/0721 →
Change of Name Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →