IP Library › Assignment 021693/0721
Patent Assignment
Reel/Frame 021693/0721

Assignment of Assignor's Interest

Recorded: 2008-10-14 Pages: 3
Assignors
TOKYO INSTITUTE OF TECHNOLOGY
Executed: 2008-10-01
SII NANOTECHNOLOGY INC.
Executed: 2008-10-01
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, JAPAN
Covered Property (1)
Probe Microscope System Suitable for Observing Sample of Long Body
Patent: 7,507,957 →
Application: 11/216,389 →
Publication: US 2006/0060778
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 2, 2005
From: FUJIHIRA, MASAMICHI; YASHUTAKE, MASATOSHI; ATAKA, TATSUAKI
To: TOKYO INSTITUTE OF TECHNOLOGY; SII NANOTECHNOLOGY INC.
Reel/Frame 017316/0747 →
Change of Name Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →