IP Library Assignment 017334/0227
Patent Assignment
Reel/Frame 017334/0227

Assignment of Assignor's Interest

Recorded: 2005-12-02 Pages: 2
Assignors
YOO, HUNG RYUL
Executed: 2005-11-24
KIM, SUN JU
Executed: 2005-11-23
Assignee
DONGBUANAM SEMICONDUCTOR INC.
891-10, DAECHI-DONG, GANGNAM-KU, SEOUL, 135-280, KOREA, REPUBLIC OF
Covered Property (1)
Field Transistor Monitoring Pattern for Shallow Trench Isolation Defects in Semiconductor Device
Patent: 7,348,189 →
Application: 11/293,660 →
Publication: US 2006/0148138
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 7, 2007
From: DONGBUANAM SEMICONDUCTOR INC.
To: DONGBU ELECTRONICS CO., LTD.
Reel/Frame 019800/0147 →